Seebauer E.G., Kratzer M.C. Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion

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размер 10.04 МБ
добавлен 17 января 2012 г.

Springer-Verlag, 2009. 294 pp.

Defect charging can affect numerous aspects of defect properties, including physical structure, rate of diffusion, chemical reactivity, and interactions with the electrons that give the semiconductor its overall characteristics. This book represents the first comprehensive account of the behavior of electrically charged defects in semiconductors. A comprehensive understanding of such behavior enables "defect engineering," whereby material performance can be improved by controlling bulk and surface defect behavior. Applications are important and diverse, including fabrication of microelectronic devices, energy production from solar power, catalysis for producing chemical products, photocatalysis for environmental remediation, and solid-state sensors. The scope of this book is quite large, which helps to identify classes of behavior that are not as readily evident from an examination of defect charging in a narrower material- or application-specific context. The text summarizes current knowledge based on experiments and computations regarding defect structure, thermodynamics, and diffusion for both bulk and surfaces in an integrated way.

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