Springer-Verlag, Berlin, 2010, 956 pages
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber.
The volume introduces many technical concepts and improvements in existing scanning probe techniques and covers a broad and impressive spectrum of recent SPM development and application in many fields of technology, biology, and medicine. The chapters are broken down under three major headings: Scanning Probe Microscopy Techniques, Characterization, and Industrial Applications. After introducing new developments in scanning probe microscopy, including sensor technology and cantilever calibration techniques, characterization data in various applications of scientific and technological interest is presented. Next, chapters on various industrial applications are presented. Characterization data and industrial applications include studies of biological materials, nanostructures, and nanotubes.
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber.
The volume introduces many technical concepts and improvements in existing scanning probe techniques and covers a broad and impressive spectrum of recent SPM development and application in many fields of technology, biology, and medicine. The chapters are broken down under three major headings: Scanning Probe Microscopy Techniques, Characterization, and Industrial Applications. After introducing new developments in scanning probe microscopy, including sensor technology and cantilever calibration techniques, characterization data in various applications of scientific and technological interest is presented. Next, chapters on various industrial applications are presented. Characterization data and industrial applications include studies of biological materials, nanostructures, and nanotubes.