2007. - 296 p.
This book brings together several leaders in theoretical research
on defects in semiconductors. Although the treatment is tutorial,
the level at which the various applications are discussed is
today's state-of-the-art in the field.
The book begins with a "big picture" view from Manuel Gardona, and
continues with a brief summary of the historical development of the
subject in Ghap.
This includes an overview of today's most commonly used method to
describe defects.