ASM Metals HandBook Vol. 17 - Nondestructive Evaluation and Quality Control

• low cycle fatigue

• LCL

• lower control limit; lower confidence limit

• LED

• light-emitting diode

• LEL

• lower explosive limit

• LINAC

• linear accelerator

• LLW

• leaky Lamb wave

• lm

• lumen

• ln

• natural logarithm (base e)

• LNG

• liquified natural gas

• LO

• local oscillator

• LPF

• low-pass filter

• lpm

• line pairs per millimeter

• LSP

• laser speckle photography

• LUT

• look-up table

• lx

• lux

• m

• meter

• m

• maximum number of factors, including selected interactions, that the design can study

• M

a

• molecular weight of air

• M

t

• molecular weight of tracer gas

• MARSE

• measured area under the rectified signal envelope

• MDL

• minimum detectable leakage

• MFD

• magnetic field disturbance

• mg

• milligram

• Mg

• megagram (metric tonne)

• MIG

• metal inert gas (welding)

• MIL-STD

• military standard

• MIVC

• magnetically induced velocity change

• min

• minimum; minute

• mL

• milliliter

• MLCD

• microwave liquid crystal display

• mm

• millimeter

• MOOT

• method of optimal truncation

• MPa

• megapascal

• mpg

• miles per gallon

• mrem

• millirem

• mSv

• millisievert

• MTF

• modulation transfer function

• mV

• millivolt

• MVp

• megavolt peak

• n

• neutrons

• N

• newton

• n

• index of refraction; fringe number; number of tests

•

• average sample size

• n

• unit vector normal to the surface

• N

• number of cycles; summation index; fringe order; length of the near field

• N

K

• Knudsen number

• N

Re

• Reynolds number

• NBS

• National Bureau of Standards

• NDE

• nondestructive evaluation

• NDI

• nondestructive inspection

• NDT

• nondestructive testing

• Nd: YAG

• neodymium: yttrium-aluminum-garnet (laser)

• nm

• nanometer

• NMR

• nuclear magnetic resonance

• No.

• number

• NTSC

• National Television Systems Committee

• OD

• outside diameter

• Oe

• oersted

• OSHA

• Occupational Safety and Health Administration

• oz

• ounce

• p

• probability

• P

• pressure

• Pa

• pascal

• PC

• printed circuit

• PCB

• printed circuit board

• pH

• negative logarithm of hydrogen ion activity

• PH

• precipitation hardening

• PIND

• particle impact noise detection

• PLC

• programmable logic control

• P/M

• powder metallurgy

• PMT

• photomultiplier tube

• POD

• probability of detection

• POFA

• probability of false alarm

• ppm

• parts per million

• ppt

• parts per trillion

• psi

• pounds per square inch

• psig

• gage pressure (pressure relative to ambient pressure) in pounds per square inch

• Q

• calibrated leakage flow

• r

• number of levels of each factor; original pixel value; radius; range

• R

• roentgen

• R

• resistance; reflection coefficient; rise time; gas constant; radius

• R

a

• arithmetic average roughness

• R

s

• effective shunt resistance

• rad

• radiation absorbed dose

• radac

• rapid digital automatic computing

• rbe

• relative biological effectiveness

• ref

• reference

• rem

• roentgen equivalent man; remainder

• RF

• radio frequency

• RFEC

• remote-field eddy current

• RGB

• red, green, blue

• RHM

• roentgen per hour at one meter

• RMM

• roentgen per minute at one meter

• rms

• root mean square

• ROC

• relative operating characteristic

• RSSS

• radiographic standard shooting sketch

• RTR

• real-time radiography

• s

• second

• S

• siemens

• S

• sensitivity; speed; spacing

• S

• signal input

• SAE

• Society of Automotive Engineers

• SAM

• scanning acoustic microscopy

• SAT

• structural assessment testing

• SDD

• source-detector distance

• SDP

• standard depth of penetration

• SEC

• secondary electron-coupled (vidicon)

• SEM

• scanning electron microscopy

• sfm

• surface feet per minute

• SiIMPATT

• silicon impact avalanche transit time

• SIT

• silicon intensified target

• SLAM

• scanning laser acoustic microscopy

• SLR

• single lens reflex

• S/N

• signal-to-noise (ratio)

• SOD

• source-object distance

• SOF

• shape and orientation factor of the flaw

• SPC

• statistical process control

• SPDT

• single pole double throw

• Sv

• sievert

• std

• standard

• t

• time; thickness

• T

• tesla

• T

• temperature; transmission coefficient

• TAB

• tape-automated bonding

• TE

• transverse electric (mode)

• TEM

• transmission electron microscopy

• TEM

• transverse electromagnetic (wave)

• TM

• transverse magnetic (mode)

• TIG

• tungsten inert gas (welding)

• TOF

• time of flight

• tsi

• tons per square inch

• U

g

• geometric unsharpness

• UCL

• upper control limit

• ULCE

• unified life cycle engineering

• USAF

• United States Air Force

• UST

• underground storage tank

• UT

• ultrasonic testing

• v

• degree of freedom; velocity

• V

• volume; velocity; variance

• VHS

• very high speed

• VHSIC

• very high speed integrated circuit

• VLSI

• very large scale integration

• vol

• volume

• W

• watt

• WORM

• write once read many

•

• sample mean

• YIG

• yttrium iron garnet

• yr

• year

• Z

• impedance; atomic number; standard normal distribution

• °

• angular measure; degree

• °C

• degree Celsius (centigrade)

• °F

• degree Fahrenheit

•

• direction of reaction

• ÷

• divided by

• =

• equals

•

• approximately equals

•

• not equal to

•

• identical with

• >

• greater than

•

• much greater than

•

• greater than or equal to

•

• infinity

•

• is proportional to; varies as

•

• integral of

• <

• less than

•

• much less than

•

• less than or equal to

• ±

• maximum deviation

• -

• minus; negative ion charge

• ×

• diameters (magnification); multiplied by

• ·

• multiplied by

• /

• per

• %

• percent

• +

• plus; positive ion charge

•

• square root of

•

• approximately; similar to

•

• partial derivative

•

• thermal diffusivity; angle of incidence

•

• angle of refraction

•

• shear strain

•

• skin depth

•

• change in quantity; increment; range; phase shift

•

• normal strain; emissivity; dielectric coefficient

•

• viscosity

•

• angle

•

• wavelength; mean free path

•

• linear attenuation coefficient; magnetic permeability; the mean (or average) of a distribution

• in.

• microinch

• m

• micron (micrometer)

•

• Poisson's ratio; frequency

•

• pi (3.141592)

•

• density; resistivity

•

• stress; standard deviation; electrical conductivity

•

• summation of

•

• shear stress

•

• angle of refraction

•

• circular frequency (angular velocity)

•

• ohm

o Greek Alphabet

• A,

• alpha

• B,

• beta

• ,

• gamma

• ,

• delta

• E,

• epsilon

• Z,

• zeta

• H,

• eta

• ,

• theta

• I,

• iota

• K,

• kappa

• ,

• lambda

• M,

• mu

• N,

• nu

• ,

• xi

• O, o

• omicron

• ,

• pi

• P,

• rho

• ,

• sigma

• T,

• tau

• ,

• upsilon

• ,

• phi

• X,

• chi

• ,

• psi

• ,

• omega

ASM Metals HandBook Vol. 17 - Nondestructive Evaluation and Quality Control

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