
5. Outlook and Perspectives
Further development of MFM needs to include better
magnetic tip calibration and repeatability as well as
environment cells (e.g., temperature and field). Mod-
ulation techniques allow the analysis of phenomena
occurring at a time scale much shorter than the res-
onance period of cantilevers (Proksch et al. 1999b).
Besides, a finer interpretation of the mechanics of
force microscopes is also highly desirable: an inde-
pendent monitoring of both the frequency shift and
the cantilever motion amplitude vs. position are key
factors towards a full analysis of dissipation (Proksch
et al. 1999a) and nonlinear oscillations in the high Q
regime (Aime
´
et al. 1999).
See also: Magnetic Materials: Transmission Electron
Microscopy; Magnets, Soft and Hard: Domains
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Figure 11
Numerical simulations: (a) local perturbation in a
Permalloy platelet (size 1 mm 1 mm) under the action of
a tip representative of standard MFM probes; (b)
simulated MFM image in the ‘‘no perturbation’’ limit;
(c) simulated MFM image taking account of tip on
sample perturbations.
443
Magnetic For ce Microscopy