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Guo J. X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques
WILEY-VCH, Verlag, 2010, 263 pages

X-Rays in Nanoscience comprehensively explores the use of X-rays in the determination of surface structures by treating spectroscopy, microscopy, and scattering techniques, all of them using different methodology. With nanotechnology becoming increasingly important, this groundbreaking text covers methods that are indispensable for determining the structure of materials, making it an essential resource for analytical chemists, materials scientists, surface chemists, spectroscopists, and polymer chemists.
In this book, recent achievements of synchrotron radiation X-ray applications in nanoscience have been reviewed. The principle of X-ray scattering, spectroscopy, and spectromicroscopy, and the current state-of-art developments in the optics and instrumentation are presented and discussed. The potential of the advanced synchrotron radiation–based techniques is illustrated using selected results obtained at synchrotron facilities. A systematic collection of the advanced tools will meet the strong needs for a wide user community with background ranging from research institutions, universities, to industry. It will be beneficial for graduate students, postdocs as well as for professional researchers.
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