WILEY-VCH, Verlag, 2010, 263 pages
X-Rays in Nanoscience comprehensively explores the use of X-rays in
the determination of surface structures by treating spectroscopy,
microscopy, and scattering techniques, all of them using different
methodology. With nanotechnology becoming increasingly important,
this groundbreaking text covers methods that are indispensable for
determining the structure of materials, making it an essential
resource for analytical chemists, materials scientists, surface
chemists, spectroscopists, and polymer chemists.
In this book, recent achievements of synchrotron radiation X-ray
applications in nanoscience have been reviewed. The principle of
X-ray scattering, spectroscopy, and spectromicroscopy, and the
current state-of-art developments in the optics and instrumentation
are presented and discussed. The potential of the advanced
synchrotron radiation–based techniques is illustrated using
selected results obtained at synchrotron facilities. A systematic
collection of the advanced tools will meet the strong needs for a
wide user community with background ranging from research
institutions, universities, to industry. It will be beneficial for
graduate students, postdocs as well as for professional
researchers.
Guo J. X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques
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