
Crystal structure solution 
515 
6.8 
Structure solution from powder data 
In  the  remainder  of  this  chapter, we  will  consider multiple practical 
structure solution examples. For  the  most  part,  individual intensities and 
structure factors will be extracted by using Le Bail's algorithm of full pattern 
decomposition. This  technique  is  chosen  instead  of 
Pawley's  approach 
because  the  former  algorithm  is  usually  more  stable  and  it  has  been 
incorporated  into  several  freely  available  software programs,  which  are 
coupled with Patterson and Fourier calculations. These are: LHPM-Rietical 
and GSAS,'  although other well-developed and tested computer codes are 
a~ailable.~ 
In 
some of the more complex examples, however, we will employ 
manual profile fitting. The latter approach is less "user-friendly" in terms of 
automation,  but  it  avoids  the  unrestricted  and  sometimes  unrealistic 
determination of the intensities of 
Ka, 
and 
Ka2 
peaks. 
By  solving crystal structures of  different classes of 
 material^,^ 
we will 
illustrate only a  few of the possible approaches to the 
ab initio 
structure 
solution  from  powder  diffraction  data.  Whenever  possible  the  structure 
factors obtained from full pattern decompositions should be used until the 
coordinates of all atoms are established. 
In 
some cases it may be necessary 
to re-determine individual structure factors based on the nearly completed 
structural model, especially when locations of lightly scattering atoms are of 
concern after all strongly scattering species have been correctly positioned in 
the  unit  cell.  This  re-determination  may  be  routinely  performed  during 
Rietveld refinement and 
will 
be briefly discussed in Chapter 
7. 
LHPM-Rietica  (authors  B.A.  Hunter  and  C.J.  Howard)  may  be  downloaded  from 
ftp:Nftp.ansto.gov.au/pub/physics/neutron/rietveld/RieticaLHPM95/ 
or 
via 
a  link  at 
http://www.ccp14.ac.uk. 
GSAS  (authors  A.C.  Larsen  and  R.B.  Von  Dreele)  may  be  downloaded  from 
http://public.lanl.gov/gsas/ 
or 
via 
a link at http://www.ccpl4.ac.uk. A convenient graphic 
user  interface  for  GSAS  (author  Brian  Toby)  may  be  downloaded  from 
http://www.ncnr.nist.gov/programs/crystallography/ 
or 
via 
http://www.ccpl4.ac.uk. 
One of these  is EXPO 
- 
an  integrated  package  for  full pattern  decomposition  and  for 
solving  crystal  structure  by  direct  methods  (authors 
A. 
Altomare,  B.  Carrozzini,  G. 
Cascarano,  C.  Giacovazzo,  A.  Guagliardi,  A.G.G.  Moliterni,  R.  Rizzi,  M.C.  Burla,  G. 
Polidori,  and  M.  Camalli).  For  information  on  how  to  obtain  the  program,  contact 
sirware@area.ba.cnr.it or visit 
http://www.irmec.ba.cnr.it/. 
There  is  a  variety  of  software  that  can  be  used  to  process  "pseudo-single  crystal" 
experimental diffraction data represented  in a form of individual structure factors or their 
squares (consult http://www.iucr.org and/or 
http://www.ccpl4.ac.uk). 
The most commonly 
used software products are SHELXS-90 and SHELXL-97 (author G.M. Sheldrick), which 
are  distributed  free  for  academic  use  (consult  SHELX  home  page  at 
http://shelx.uni- 
ac.gwdg.de/SHELX/index.html 
for  details).  Unless  noted  otherwise,  processing  of  the 
individual structure factor data, direct phase determination, Patterson-, Fourier- and E-map 
calculations shown  in  this  chapter  were performed  using  WinCSD  software,  which  is 
available from STOE 
& 
Cie, Gmbh 
(http://www.stoe.com/products/index.htm).