
Crystal structure solution 
529 
Table 
6.7.  The  three-dimensional  electron  density  distribution  in  the  symmetrically 
independent part  of the  unit  cell  of LaNi,,,,Sn,,,  calculated  using  the  observed  structure 
factors determined from Le Bail's extraction 
(Table 
6.4) and phase angles determined by the 
La atom placed in the l(a), and Ni atoms placed in the 2(c) and 3(g) sites of the space group 
P6lrnmm (RF 
= 
6.9 
%). 
Fourier map peak number 
x 
Y 
z 
Peak height 
1 
0 
0 
0 
70 
2 
0.5 
0 
0.5  27 
3  0.6667  0.3333  0 
25 
4 
0  0  0.304  3 
The major difference between the two Fourier maps  shown in 
Figure 
6.12, 
Figure 
6.13, 
Table 
6.6,  and 
Table 
6.7 is  that  peak  heights  of  the 
correctly placed atoms are much stronger than the heights of  false peaks.' 
Furthermore, the coordinates of false peaks vary but the coordinates of true 
maxima remain the same. As is easy to verify by the calculation of distances, 
none of the peaks listed below peak No. 
3 
in 
Table 
6.7 has a reasonable 
distance to the La and Ni atoms already located in the unit cell. 
Considering the low 
RF, 
the absence of new peaks on the second Fourier 
map,  which  may  correspond  to  additional  atoms,  and  the  fact  that  the 
contents  of  the  unit  cell  matches  that  established  from  the  gravimetric 
density  of  the  material,  we  conclude  that  all  atoms  in  the  unit  cell  of 
LaNi4.85Sno.15 have been located. It makes no sense to proceed with the least 
squares refinement of atomic parameters using structure factors determined 
from Le Bail's extraction, and the refinement of the crystal structure should 
be completed using the Rietveld technique (see Chapter 
7). 
The coordinates 
and possible distribution of atoms are  listed in 
Table 
6.8 and the  crystal 
structure of the material is illustrated in 
Figure 
6.14. 
Table 
6.8. Coordinates of atoms in the unit cell of LaNi4,85Sno.15 
as 
determined from powder 
diffraction data. All coordinates are fixed by symmetry of the corresponding  sites and only 
population and displacement parameters can and should be refined using Rietveld technique. 
Atom  Site 
x 
Y 
z 
La  ](a>  0  0  0 
0.97Ni+0.03Sn  2(c)  113  213  0 
0.97Ni+O.O3Sn  3(g)  112 
0 
1 
I2 
' 
False peaks  (e.g. peak No. 
4 
in 
Table 
6.6, which  is easily recognizable  in 
Figure 
6.12) 
appear on Fourier maps due to a variety of reasons: i) the largest contribution comes from 
the truncation  of the Fourier  summation  (Eq. 2.133)  because  only a  limited  amount of 
diffraction  data is  available (see 
Table 
6.4);  ii) the  structure  amplitudes  are not  exact, 
especially  when  powder  diffraction  data  were  used  in  combination  with  Le  Bail's 
extraction, and iii) phase angles calculated using atomic parameters,  which  are not fully 
refined,  are still  imprecise  because we used randomly  assigned  displacement  parameters 
and assumed completely random distribution of Ni and Sn in two possible sites.