
616 
Chapter 
7 
sites are depleted in Sn, while some Sn atoms are still located there, and the 
3(g) 
sites are enriched in Sn. 
When the precision of x-ray diffraction data is high, which appears to be 
the  case  here,  it  is  possible  to  refine  the  population  of  different 
crystallographic sites to eliminate guesses and obtain a quantitative result. 
The best way to do so is to return to the overall displacement parameter and 
instead of refining individual atomic displacement parameters, include the 
refinement  of  the  individual population  parameters  in  the  corresponding 
sites.' 
Assuming 
full occupancy of all sites, i.e. 
gNil 
= 
1 
- 
gslll 
and 
g~i2 
= 
1 
- 
gsn2, 
the corresponding constraints 
(Eq. 
7.9) 
should be set at Ansnl 
= 
-1 
xAnNil and 
Ansn2. 
= 
-lxAnNi2. The  file 
Ch7ExOlc.inp, 
in  which  all  parameters  are 
properly  constrained, is  found  on  the 
CD. 
This Rietveld refinement  step 
results in the following occupancies of the two sites in question: 
The negative occupancy by  Sn  of the 
2(c) site has no physical sense, 
especially given that the absolute value of the occupancy is comparable with 
the standard deviation. Thus, this site appears to be pure Ni. On  the other 
hand, it is confirmed by the refinement that all Sn is segregated in the 3(g) 
sites. It is worth noting that when the chemical composition of the forn~ula 
unit  is  calculated  from  the  refined  occupancies,  the  result  is 
LaNi4.83c2,Sno.17(2), which matches the  as-prepared chemical composition of 
the material within one standard de~iation.~ 
We note that since one of the sites, l(a) seems to be fully occupied by La, the least squares 
refinement of the population parameters of the two remaining sites, 2(c) and 3(g) may be 
carried  out  together  with  the  scale  factor.  Only when  the  population  of  all  sites  is  in 
question, special precautions should be taken to avoid severe correlation between the scale 
factor and all population parameters. When all sites are occupied partially, diffraction data 
alone  normally  do not  provide  an  adequate answer  because  both 
K 
and  are  simple 
multipliers,  which  affect  the scattered  intensity.  Other experimental  methods should  be 
employed  to establish andlor prove that defects exist on all lattice sites. One of these are 
precise gravimetric density data. 
Refinement  of the crystal structure is, therefore,  a powerful chemical analysis technique. 
Unlike  conventional  chemical  analysis,  which  only yields  the bulk  composition  of the 
sample, powder diffraction  analysis facilitates  accurate determination  of the occupancies 
of  different  crystallographic  sites  by  various  chemical  elements,  or  in  other  words, 
establishes precise chemical composition of the crystal at the atomic resolution. It should 
be  noted  that  the  results  may  be  considered  reliable  only  when  the  difference  in  the 
scattering ability of atoms in question is significant, in addition to a very high quality of 
experimental data. This is indeed the case here because scattering factors of Sn and Ni are 
related as 
-1.8: 
1.