
624 
Chapter 
7 
corresponding  input  data  file,  Ch7ExOli.inp,  is  found  on  the  CD.  For 
LHPM-Rietica,  a  single  data  file  should  contain  both  sets  of  powder 
diffraction  data,  and  these  are  found  on  the 
CD 
in  the  file 
Ch7ExOl-Cu&MoKa.dat.  The  progression  of  Rietveld  refinement  is 
illustrated in 
Table 
7.7. The initial residuals are shown in the first row in 
Table 
7.7, where expectedly, the figures of merit for the second set of data 
(Mo 
Ka) 
are much worse than for the first (see 
Table 
7.3 and 
Table 
7.5). 
Table 
7.7. 
The  progress  of  the  combined  Rietveld  refinement  of  the  crystal  structure  of 
LaNi4.ssSno 
Is 
employing two sets of experimental  data obtained  using  Cu 
Ka 
and Mo 
Ka 
radiations. 
Refined parameters 
Cu  Mo 
R,  R,, 
RB 
R,  Rw, 
RB 
Initial 
11.78  14.45  11.45  523.6  612.5  589.1 
Scale factors 
" 
6.97  10.08  4.40  22.44  27.02  8.12 
Scale factors plus 
a, 
c 
and zero shifts 
8.00  11.38  4.60  7.55  11.39  1.40 
As above plus peak shape, background 
7.44  10.51  4.35  6.38  10.27  1.42 
As above plus 
Pv 
(all) and population 
7.29  10.39  4.13  6.43  10.30  1.53 
parameter, 
n, 
in 
3(g) 
site 
All plus an impurity phase 
6.87  9.02  4.13  5.99  8.62  1.40 
a 
When multiple sets of data are used in a combined Rietveld refinement, the first set has a 
fixed scale, 
k 
= 
1, 
but all other sets have their own scales in addition to a phase scale. 
Thus, in our case when we have two sets of diffraction data and one crystalline phase, two 
scale factors 
(K 
and 
kM, 
Ka) 
have been refined independently (see 
Eq. 
7.10, 
below). 
When more than one set of experimental diffraction data is employed in 
the combined Rietveld refinement, the minimized function (in the simplest 
case of 
Eq. 
7.3) becomes 
In 
Eq. 
7.10, 
h 
is the number of different sets of powder diffraction data, 
ns 
is the number of  data points collected in the 
sth 
set, and k,  is the scale 
factor  for  the 
sth 
diffraction  pattern,  which  appears  because  scattered 
intensity is measured on  a relative  scale. Other notations are identical to 
Eq. 7.3. Different scale factors, k,  and 
K, 
are simple multipliers. Hence, they 
strongly correlate, and usually are not refined simultaneously. Constraining 
one of the  scale factors (usually kl, for the  first diffraction data set) at  1 
enables successful refinement of the phase scale 
(9 
and scale factors of all 
remaining sets of diffraction data (k2, k3, 
. . 
., 
kh). Equations 7.4, 7.6 and 7.7 
are modified in the same way as 
Eq. 
7.3 for a combined Rietveld refinement. 
Furthermore, it is often the case that x-ray and neutron, or conventional x- 
ray and synchrotron data are used in combined refinements, therefore, the