
© 1999 by CRC Press LLC
Durig, U., Zuger, O., and Stalder, A. (1992), “Interaction Force Detection in Scanning Probe Microscopy:
Methods and Applications,” J. Appl. Phys. 72, 1778–1797.
Eigler, D.M. and Schweizer, E.K. (1990), “Positioning Single Atoms with a Scanning Tunneling Micro-
scope,” Nature 344, 524–528.
Erlandsson, R., McClelland, G.M., Mate, C.M., and Chiang, S. (1988a), “Atomic Force Microscopy Using
Optical Interferometry,” J. Vac. Sci. Technol. A 6, 266–270.
Erlandsson, R., Hadzioannou, G., Mate, C.M., McClelland, G.M., and Chiang, S. (1988b), “Atomic-Scale
Friction between the Muscovite Mica Cleavage Plane and a Tungsten Tip,” J. Chem. Phys. 69,
5190–5193.
Fan, L.S., Tai, Y.C., and Muller, R.S. (1989), “IC-Processed Electrostatic Micromotors,” Sensors Actuators
20, 41–47.
Foster, J. and Frommer, J. (1988), “Imaging of Liquid Crystal Using a Tunneling Microscope,” Nature
333, 542–547.
Frisbie, C.D., Rozsnyai, L.F., Noy, A., Wrighton, M.S., and Lieber, C.M. (1994), “Functional Group
Imaging by Chemical Force Microscopy,” Science 265, 2071–2074.
Frommer, J. (1992), “Scanning Tunneling Microscopy and Atomic Force Microscopy in Organic Chem-
istry,” Angew. Chem. Int. Ed. Engl. 31, 1298–1328.
Fujisawa, S., Ohta, M., Konishi, T., Sugawara, Y., and Morita, S. (1994), “Difference between the Forces
Measured by an Optical Lever Deflection and by an Optical Interferometer in an Atomic Force
Microscope,” Rev. Sci. Instrum. 65, 644–647.
Ganti, S. and Bhushan, B. (1995), “Generalized Fractal Analysis and Its Applications to Engineering
Surfaces,” Wear 180, 17–34.
Garcia, N. and Binh, Vu T. (1992), “van der Waals Forces in Atomic Force Microscopy Operating in
Liquids: A Spherical-Tip Model,” Phys. Rev. B 46, 7946–7948.
Gee, M.L., McGuiggan, P.M., Israelachvili, J.N., and Homola, A.M. (1990), “Liquid to Solid-like Transi-
tions of Molecularly Thin Films under Shear,” J. Chem. Phys. 93, 1895–1906.
Georges, J.M., Millot, S., Loubet, J.L., and Tonck, A. (1993), “Drainage of Thin Liquid Films between
Relatively Smooth Surfaces,” J. Chem. Phys. 98, 7345–7360.
Georges, J.M., Tonck, A., and Mazuyer, D. (1994), “Interfacial Friction of Wetted Monolayers,” Wear 175,
59–62.
Germann, G.J., Cohen, S.R., Neubauer, G., McClelland, G.M., and Seki, H. (1993), “Atomic-Scale Friction
of a Diamond Tip on Diamond (100) and (111) Surfaces,” J. Appl. Phys. 73, 163–167.
Giaever, I. (1960), “Energy Gap in Superconductors Measured by Electron Tunneling,” Phys. Rev. Lett. 5,
147–148.
Giessibl, F.J., Gerber, Ch., and Binnig, G. (1991), “A Low-Temperature Atomic Force/Scanning Tunneling
Microscope for Ultrahigh Vacuum,” J. Vac. Sci. Technol. B9, 984–988.
Giles, R., Cleveland, J.P., Manne, S., Hansma, P.K., Drake, B., Maivald, P., Boles, C., Gurley, J., and Elings,
V. (1993), “Noncontact Force Microscopy in Liquids,” Appl. Phys. Lett. 63, 617–618.
Goddenhenrich, T., Lemke, H., Hartmann, U., and Heiden, C. (1990), “Force Microscope with Capacitive
Displacement Detection,” J. Vac. Sci. Technol. A8, 383–387.
Gould, S.A.C., Drake, B., Prater, C.B., Weisenhorn, A.L., Manne, S., Hansma, H.G., Hansma, P.K. et al.
(1990), “From Atoms to Integrated Circuit Chips, Blood Cells, and Bacteria with the Atomic Force
Microscope,” J. Vac. Sci. Technol. A8, 369–373.
Granick, S. (1991), “Motions and Relaxations of Confined Liquids,” Science 253, 1374–1379.
Grutter, P., Ruger, D., Mamin, H.J., Castillo, G., Lin, C.-J., McFadyen, I.R., Valletta, R.M., Wolter, O.,
Bayer, T., and Greschner, J. (1991), “Magnetic Force Microscopy with Batch-Fabricated Force
Sensors,” J. App. Phys. 69, 5883–5885.
Grutter, P., Mamin, H.J., and Rugar, D. (1992), “Magnetic Force Microscopy (MFM),” in Scanning
Tunneling Microscopy II (R. Wiesendanger and H.J. Guntherodt, eds.), pp. 151–207, Springer-
Verlag, Berlin.