674 Charged Particle and Photon Interactions with Matter
In the case of photolysis of polystyrene and polystyrene-related polymers in cyclohexane, the pho-
todecomposition of polymers does not occur effectively, and singlet monomer and excimer states
(Tagawa and Schnabel, 1980a) and also triplet states (Tagawa et al., 1984) of polystyrene are observed
by laser ash photolysis. But, in the case of photolysis of polystyrene and poly-α-methylstyrene
in chlorinated solvents, the photodecomposition of polymers occurs very effectively and polymer
excited states are converted to charge-transfer (CT) complexes. The CT complex was observed by
laser ash photolysis (Tagawa and Schnabel, 1980b, 1983). In the case of radiolysis of polystyrene-
related polymers in cyclohexane, the photodecomposition of polymers does not occur effectively,
and singlet monomer and excimer states of polystyrene and poly-α-methylstyrene are observed by
picosecond pulse radiolysis (Tagawa et al., 1981; Itagaki et al., 1983, 1987, 1992). The CT complex
was also observed in the case of pulse radiolysis of polystyrene and poly-α-methylstyrene in chlo-
rinated solvents (Tagawa et al., 1981; Washio et al., 1983). Based on these studies, the combination
of very effective dissociative electron attachment with geminate ion recombination produces a CT
complex and then polymer radicals, and plays an important role in the initial reactions of highly
sensitive decomposition of polystyrene in chlorinated solvents with oxygen.
25.2.1.3 highly
s
ensitive
electron b
eam,
x
-ray,
and euv r
esists
through
the Combination of d
issociative
electron
a
ttachment
with g
eminate
i
on
r
ecombination
Photo and radiation induced decomposition of polymers occurs very effectively in polystyrene
related polymer solutions in chlorinated solvents, but photo and radiation induced polymer cross-
linking occurs very effectively in chlorinated polystyrene-related polymers in the solid state.
Chlorinated polystyrene-related polymer lms were used for EB and excimer negative resists.
In the 1980s, the increasing density of VLSI required the development of submicron lithogra-
phy, such as excimer, x-ray, EB, and IB lithography. At that time, much attention was devoted to
negative EB resists (Imamura, 1979; Imamura et al., 1982; Kamoshida et al., 1983) containing
chlorinated or chloromethylated phenyl side chains. This type of enhancement is observed in
other resists containing chlorinated or chloromethylated silicon-containing resists (Morita et al.,
1983, 1984). EB (Tabata et al., 1984, 1985; Tagawa, 1986, 1987) and IB (Tagawa, 1993) pulse
radiolysis and excimer laser ash photolysis (Tagawa, 1986, 1987) studies on resist materials
were carried out in order to elucidate the detailed cross-linking reaction of chlorinated or chlo-
romethylated excimer, x-ray, EB, and IB resists. The same CT complex is conrmed in both
photo- and radiation-induced chlorinated or chloromethylated resist reactions. Similar reactions
of iodination (Shiraishi et al., 1980) of phenyl rings are used for EB resists. In both photolysis
and radiolysis, the generation of two polymer radicals and acid through dissociative electron
attachment and decomposition of the CT complex is observed. But the initial steps of EB and
x-ray resist reactions are mainly induced by ionization and are different from the initial steps of
photoresists induced by excited states of molecules. The combination of geminate ion recombina-
tion with dissociative electron attachment induces pair production of polymer radicals, which in
turn induces highly effective cross-linking even for chloromethylpoly-α-methylstyrene, although
poly-α-methylstyrene is well known to be decomposed on irradiation. The fundamental radiation
chemistry of nanospace reactions due to the geminate recombination in organic materials, such
as liquid alkanes (Thomas et al., 1968; Sauer and Jonah, 1980; van den Ende et al., 1980; Tagawa et al.,
1983, 1989; Yoshida et al., 1987; Le Motais and Jonah, 1989; Saeki et al., 2002, 2004, 2005a)
and liquid aromatics (Okamoto et al., 2003, 2007), and also the formation processes of the CT
complex of polystyrene-related polymers through dissociative electron attachment and geminate
recombination (Okamoto et al., 2001, 2006) have been studied extensively by nanosecond,
picosecond, and subpicosecond pulse radiolysis.
Recently, a single-component chemically amplied resist based on dehalogenation of polymers
has been reported (Yamamoto et al., 2007a). The reaction mechanism of this resist is acid formation