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Accelerated friction tests were conducted by sliding a diamond tip (20-µm radius) and a single-crystal
sapphire ball (3-mm diameter) against the films. The data are compared in Figure 10.55. We note that
the coefficients of friction of all of the coatings are low (≈0.06 to 0.13) when these were slid against a
diamond tip, whereas these coatings exhibited higher coefficients of friction from 0.20 to 0.50 when slid
against a sapphire ball. SiC coating exhibited the lowest coefficients of friction among other coatings,
when it was slid against a sapphire ball. Based on optical examination of worn samples, there were no
wear tracks formed when cathodic arc carbon, ion beam carbon, PECVD carbon, and SiC coatings were
slid for 2 h against a diamond tip at 10 mN load. Sputtered carbon and sputtered Al
2
O
3
coatings exhibited
a small amount of wear debris, because of their lower scratch resistance. On the other hand, for the
coatings slid for 2 h against a sapphire ball, the cathodic arc carbon and SiC coatings on Al
2
O
3
–TiC
substrate did not form any wear track, Figure 10.56. The higher wear performances of cathodic arc carbon,
ion beam carbon, and SiC coatings are attributed to their high resistance to scratch and high hardnesses
and elastic moduli.
Magnetic thin-film head sliders made with Al
2
O
3
–TiC substrate are used in magnetic storage applica-
tions (Bhushan, 1996). Multilayered thin-film pole-tip structure present on the head slider surface wears
more rapidly than the Al
2
O
3
–TiC substrate, which is much harder. Pole-tip recession (PTR) is a serious
concern in magnetic storage. Two of the DLC coatings superior in mechanical properties — ion beam
and cathodic arc carbon — were deposited on the air bearing surfaces of Al
2
O
3
–TiC head sliders. The
functional tests were conducted by running a metal-particle (MP) tape in a computer tape drive. Average
PTRs as a function of sliding distance data are presented in Figure 10.57. We note that PTR increases for
the uncoated head, whereas for the coated heads there is a slight increase in PTR in early sliding followed
by little change. Thus, coatings provide protection.
This example clearly suggests that material characterizations (hardness, elastic modulus, and scratch
resistance) are powerful ways of screening materials and the data correlates well with the functional
friction and wear performance.
10.6.3 Residual Stress Measurements Using Nanoindentation
Indentation measurements similar to those used to determine the hardness and elastic modulus of a film
can also be used to measure the residual stresses in it. When a compressive force on a biaxially stressed
film during indentation is applied in a direction perpendicular to the film, yielding will occur at a smaller
applied compressive force while a film is stressed in biaxial tension as compared with the unstressed film.
Thus, the biaxial tension decreases hardness and the biaxial compression increases hardness (Swain et al.,
1977; Vitovec, 1986). LaFontaine et al. (1990c, 1991) used the nanoindentation technique to measure the
effect of residual stresses on the hardness of thin films. For samples that do not undergo large structural
changes, changes in hardness with time reflect a change in residual stress in the film (LaFontaine et al.,
1990c, 1991). LaFontaine et al. (1991) measured the stress relaxation in thin aluminum films and the
residual stresses on identical films using an X-ray stress measurement technique. Results of the indenta-
tion and X-ray stress measurements compared closely, implying that decrease in hardness with time
resulted from the relaxation of residual stresses. Thus, the indentation measurements can be used to
investigate stresses in thin films. Due to the presence of a stress gradient in thicker (>1 µm) films, the
technique is not applicable.
Tsukamoto et al. (1987) measured the deflection at the center of the bent beam (bent as a result of
residual stresses in the film) by pressing the beam flat with a nanoindenter. The bent beam is placed on
a flat glass surface supported by two fulcrums, and a load–deflection curve is generated (Figure 10.58).
The distance h
a
can be estimated from the inflection point in the curve. Because of limited flatness of
most substrates, the film is removed from the substrate, and then the initial deflection is measured. The
true deflection resulting from residual stresses in the film equal to h
a
– h
b
. The curvature (1/R) of the
substrate can then be calculated by the geometric relationship,