
1004 Part 5 Special Structures
Table 5.2-15 Surface core level shifts for elemental semiconductors
1
Crystal Face Reconstruction Core level
Surface shifts (eV )
S
1
S
2
S
3
S
4
Diamond (111) 2×1 1s −0.8
Si
(100) 2×1
2p
−0.49 (3) −0.230 0.062 0.29 (5)
c(2 × 4) −0.485 −0.205 0.062 0.22
(111) 2×1 −0.46 (9) −0.14 0.23 (6) 0.64
7×7 −0.74 (5) −0.07 (5) 0.30 (6) 0.52 (3)
Ge
(100) 2×1
3d
−0.49 (7) −0.21 (3)
c(4 × 2) −0.60 −0.24
(111) 2×1 −0.49 (8) 0.44
c(2 × 8) −0.73 (3) −0.24 (3)
1
Data are average values from various authors. Errors are standard deviations. References to original papers and individual errors
are given in [2.47]
Table 5.2-16 Surface core level shifts at Ga and As sites in
GaAs
1
Face Reconstruction
Surface shift (eV )
Ga(3d) As(3d)
(100) c(4 × 4) +0.49 −0.285 (5)
+0.55
c(2 × 8) +0.3 −0.26 (1)
+0.55 (0)
4×6 +0.4 −0.45 (16)
−0.21
(110) 1×1 +0.28 (0) −0.373 (5)
1
Data are average values from various authors. Errors are
standard deviations. References to the original papers and
individual errors are given in [2.47]
gives the shifts for the C(1s), Si(2p), and Ge(3d) lev-
els for various faces and reconstructions. The surface
shifts of the 3d levels at the Ga and As sites of GaAs
(110) and (100) faces are given in Table 5.2-16.
The p and d levels are spin–orbit split and give rise
to doublets. Nonequivalent atoms increase further the
number of surface shifts. Up to four components are
observed in Si and Ge and up to two in GaAs.
Unresolved surface shifts for various III–V com-
pounds are given in Table 5.2-17.
Surface State Bands
The origin and nature of surface states have been dis-
cussed in the introduction to Sect. 5.2.3. Here the energy
versus k
along significant directions of the SBZ and/or
the density of states are reported for various recon-
structed/relaxed surfaces. The experimental data were
Table 5.2-17 Surface core level shifts at (110) surfaces of
III–V compounds
1
Crystal Surface shifts (eV )
Cation Anion
AlSb +0.38 −0.38
GaP +0.31 (2) −0.41 (0)
GaAs +0.28 (0) −0.370 (5)
GaSb +0.30 −0.36
InP +0.30 (2) −0.30 (1)
InAs +0.27 (1) −0.30 (0)
InSb +0.23 (1) −0.29(1)
1
Data are average values from various authors. Errors are
standard deviations. References to the original papers and
individual errors are given in [2.47]
obtained mainly with ARUPS and KRIPES or by optical,
energy loss, and STM techniques.
Because of the large amount of available data, only
a selection of dispersion curves and surfaces has been
given. For more detailed information, the reader is re-
ferred to [2.10,11].
The rearrangement of unsaturated dangling bonds at
the surface is considered to be the driving force for re-
construction of semiconductors. An example of DBs is
shown in Fig. 5.2-32a,b that give contours of the charge
density for the filled (P) and empty (Ga) surface states
on the (110) surface of GaP. In Fig. 5.2-32c, a com-
parison is made with an STM image taken with a bias
voltage that allows the observation of filled and empty
states.
Figures 5.2-33 – 5.2-36 and 5.2-38 – 5.2-40 give the
E(k
) curves for selected surfaces of diamond, Si, Ge,
Part 5 2.3