• формат pdf
  • размер 11.47 МБ
  • добавлен 04 сентября 2011 г.
Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope
3rd edition, Springer Science+Business Media, New York, 2011, 491 pages
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.
An Introduction to EELS
Energy-Loss Instrumentation
Physics of Electron Scattering
Quantitative Analysis of Energy-Loss Data
TEM Applications of EELS
Appendix A Bethe Theory for High Incident Energies and Anisotropic Materials
A.1 Anisotropic Specimens
Appendix B Computer Programs
Читать онлайн
Похожие разделы
Смотрите также

Berakdar J., Kirschner J. (Eds.) Correlation Spectroscopy of Surfaces, Thin Films, and Nanostructures

  • формат pdf
  • размер 6.18 МБ
  • добавлен 18 февраля 2011 г.
WILEY-VCH, 2004, 238p. A First-Principles Scheme for Calculatingv the Electronic Structure of Strongly Correlated Materials: GW+DMFT A Many-body Approach to the Electronic and Optical Properties of Copper and Silver Correlation Spectroscopy of Nano-size Materials Electron–Electron Coincidence Studies on Atomic Targets: A Review of (e,2e) and (e,3e) Experiments Studying the Details of the Electron–Electron Interaction in Solids and Surfaces Two-El...

Chung Y.-W. Practical guide to surface science and spectroscopy

  • формат pdf
  • размер 1.6 МБ
  • добавлен 27 января 2011 г.
Academic Press, 2001, 186p. Fundamental Concepts in Ultrahigh Vacuum, Surface Preparation, and Electron Spectroscopy Auger Electron Spectroscopy Photoelectron Spectroscopy Inelastic Scattering of Electrons and Ions Low-Energy Electron Diffraction Scanning Probe Microscopy Interfacial Segregation Metal–Semiconductor Interfaces Gas–Surface Interactions

Egerton R.F. Physical Principles of Electron Microscopy. An Introduction to TEM, SEM, and AEM

  • формат pdf
  • размер 5.38 МБ
  • добавлен 12 января 2011 г.
Springer, 2005, 202p. Preface An Introduction to Microscopy Limitations of the Human Eye The Light-Optical Microscope The X-ray Microscope The Transmission Electron Microscope The Scanning Electron Microscope Scanning Transmission Electron Microscope Analytical Electron Microscopy Scanning-Probe Microscopes Electron Optics PropertiesofanIdealImage ImaginginLightOptics ImagingwithElectrons Focusing Properties of a Thin Magnetic Lens C...

Garratt-Reed A.J., Bell D.C. Energy-dispersive X-Ray analysis in the electron microscope

  • формат pdf
  • размер 3.27 МБ
  • добавлен 21 января 2011 г.
BIOS Scientific Publishers Limited, 2003, 151p. History Principles The energy-dispersive X-ray detector Spectral processing Energy-dispersive X-ray microanalysis in the scanning electron microscope X-ray microanalysis in the transmission electron microscope X-ray mapping Energy-dispersive X-ray analysis compared with other techniques Bibliography Index

Goodhew P.J. et al. Electron microscopy and analysis

  • формат pdf
  • размер 19.72 МБ
  • добавлен 13 января 2011 г.
3d edition, Taylor&Francis, 2001, 265p. Microscopy with light and electrons Electrons and their interaction with the specimen Electron diffraction The transmission electron microscope The scanning electron microscope Chemical analysis in the electron microscope Electron microscopy and other techniques

Reimer L., Kohl H. Transmission Electron Microscopy. Physics of Image Formation

  • формат pdf
  • размер 5.21 МБ
  • добавлен 13 января 2011 г.
Springer, 2008, 602p. Introduction TransmissionElectronMicroscopy Alternative Types of Electron Microscopy Particle Optics of Electrons Acceleration and De?ection of Electrons ElectronLenses Lens Aberrations Correction of Aberrations and Microscope Alignment Wave Optics of Electrons ElectronWavesandPhaseShifts Fresnel and Fraunhofer Di?raction Wave-Optical Formulation of Imaging Elements of a Transmission Electron Microscope ElectronGuns The Illu...

Vickerman J.C., Gilmore I.S. (eds.) Surface analysis - the principal techniques

  • формат pdf
  • размер 15.8 МБ
  • добавлен 01 марта 2011 г.
2nd Ed. , 2009, John Wiley & Sons, 666 p. Introduction How do we De?ne the Surface? How Many Atoms in a Surface? Information Required Surface Sensitivity Radiation Effects – Surface Damage Complexity of the Data Auger Electron Spectroscopy Introduction Principle of the Auger Process Instrumentation Quantitative Analysis Depth Pro?le Analysis Summary Electron Spectroscopy for Chemical Analysis Overview X-ray Interaction withMatter, t...

Wang Z.L. Reflection electron microscopy and spectroscopy for surface analysis

  • формат pdf
  • размер 67.37 МБ
  • добавлен 03 февраля 2011 г.
Cambridge University Press, 1996, 436 p. Symbols and definitions Kinematical electron diffraction Reflection high-energy electron diffraction Dynamical theories of RHEED Resonance reflections in RHEED Imaging surfaces in TEM Contrast mechanisms of reflected electron imaging Applications of UHV REM Applications of non-UHV REM Phonon scattering in RHEED Valence excitation in RHEED Atomic inner shell excitations in RHEED Novel techniques associated...

Watts J.F., Wolstenholme J. An Introduction to Surface Analysis by XPS and AES

  • формат pdf
  • размер 12.72 МБ
  • добавлен 19 января 2011 г.
Wiley, 2003, 212p. Electron spectroscopy: some basic concepts Electron spectrometer design The electron spectrum: qualitative and quantitative interpretation Compositional depth profiling Applications of electron spectroscopy in materials science Comparison of XPS and AES with other analytical techniques

Williams D.B., Carter C.B. Transmission Electron Microscopy. A Textbook for Materials Science

  • формат pdf
  • размер 44.64 МБ
  • добавлен 21 января 2011 г.
2nd ed. , Springer, 2009. - 832 p. = BASICS The Transmission Electron Microscope Scattering and Diffraction Elastic Scattering Inelastic Scattering and Beam Damage Electron Sources Lenses, Apertures, and Resolution How to ‘See’ Electrons Pumps and Holders The Instrument Specimen Preparation = DIFFRACTION Diffraction in TEM Thinking in Reciprocal Space Diffracted Beams Dispersion Surfaces Diffraction from Crystals Diffraction from Small Volumes...