Watts J.F., Wolstenholme J. An Introduction to Surface Analysis by XPS and AES

CRC Press, 2003, 310p. Introduction Background History of Microscopy Scanning Probe Microscopes (SPMs) Scanning Tunneling Microscope (STM) Electron Tunneling Atomic Force Microscope (AFM) Modes of Operation of AFM Simultaneous AFM and Scanning Near-Field Fluorescence (SNOM and SNOM–AFM) Friction Force Microscopy (FFM) STM and AFM Studies under Fluids Sample Preparation Procedures for STM and AFM Calibration and Image Analysis of STM and AFM...

Wiley -VCH, 2002, 352p. Introduction Electron detection Ion detection Photon detection Scanning probe microscopy Summary and comparison of techniques Surface and thin film analytical equipment suppliers

Surface Science Reports 59 (2005) p.1–152 The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities. For this reason the measurement of force cur...

Elsevier Surface Science Reports 34 (1999) p.1-104 Atomic force microscopy (AFM) force-distance curves have become a fundamental tool in several fields of research, such as surface science, materials engineering, biochemistry and biology. Furthermore, they have great importance for the study of surface interactions from a theoretical point of view. Force-distance curves have been employed for the study of numerous materials properties and for t...

Academic Press, 2001, 186p. Fundamental Concepts in Ultrahigh Vacuum, Surface Preparation, and Electron Spectroscopy Auger Electron Spectroscopy Photoelectron Spectroscopy Inelastic Scattering of Electrons and Ions Low-Energy Electron Diffraction Scanning Probe Microscopy Interfacial Segregation Metal–Semiconductor Interfaces Gas–Surface Interactions

Kluwer, 2002, 451p. Photon beam damage and charging at solid surfaces Electron beam damage at solid surfaces Ion beam bombardment effects on solid surfaces at energies used for sputter depth profiling Characterization of surface topography Depth profiling using sputtering methods

Kluwer Academic Publishers, 2002, 302 p. Ultrahigh Vacuum and Vacuum Compatibility of Materials Cryogenic Sample Transfer for Preservation of Surface Chemistry Specimen Handling: Cleaning and Processing Atomically Clean Surfaces of Elemental Solids Specimen Treatments: Surface Preparation of Metal Compound Materials (Mainly Oxides) In Situ Processing by Gas or Alkali Metal Dosing and by Cleavage Chemical Modification of Surfaces Physical and C...

Springer-Verlag, Berlin, 2011, 323 pages The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of...

2nd Ed. , 2009, John Wiley & Sons, 666 p. Introduction How do we De?ne the Surface? How Many Atoms in a Surface? Information Required Surface Sensitivity Radiation Effects – Surface Damage Complexity of the Data Auger Electron Spectroscopy Introduction Principle of the Auger Process Instrumentation Quantitative Analysis Depth Pro?le Analysis Summary Electron Spectroscopy for Chemical Analysis Overview X-ray Interaction withMatter, t...

2 ed, Cambridge University Press, 1994, 586 p. Introduction Surface crystallography and diffraction Electron spectroscopies Incident ion techniques Desorption spectroscopies Tunnelling microscopy Work function techniques Atomic and molecular beam scattering Vibrational spectroscopies