
© 1999 by CRC Press LLC
In practice, it is difficult to measure the forces between two perfectly flat surfaces because of the
stringent requirement of perfect alignment for making reliable measurements at the angstrom level. It
is far easier to measure the forces between curved surfaces, for example, two spheres, a sphere and a flat,
or two crossed cylinders. As an added convenience, the force
F
(
D
) measured between two curved surfaces
can be directly related to the energy per unit area
E
(
D
) between two flat surfaces at the same separation,
D
. This is given by the so-called “Derjaguin” approximation:
(9.6)
where
R
is the radius of the sphere (for a sphere and a flat) or the radii of the cylinders (for two crossed
cylinders).
9.2.3 The Surface Force Apparatus and the Atomic Force Microscope
In a typical force-measuring experiment, two or more of the above displacement parameters:
∆
D
0
,
∆
D
S
,
∆
D
, and
K
S
, are directly or indirectly measured, from which the third displacement and resulting force
law
F
(
D
) are deduced using Equations 9.4 and 9.5. For example, in SFA experiments,
∆
D
0
is changed by
expanding a piezoelectric crystal by a known amount and the resulting change in surface separation
∆
D
is measured optically, from which the spring deflection ∆D
S
is obtained. In contrast, in AFM experiments,
∆D
0
and ∆D
S
are measured using a combination of piezoelectric, optical, capacitance, or magnetic
techniques, from which the surface separation ∆D is deduced. Once a force law is established, the geometry
of the two surfaces must also be known (e.g., the radii R of the surfaces) before one can use Equation 9.6
or some other equation that enables the results to be compared with theory or with other experiments.
Israelachvili (1989, 1991), Horn (1990), and Ducker et al. (1991) have described various types of SFAs
suitable for making adhesion and force law measurements between two curved molecularly smooth
surfaces immersed in liquids or controlled vapors. The optical technique used in these measurements
employs multiple beam interference fringes which allows for surface separations D to be measured to
±1 Å. From the shapes of the interference fringes, one also obtains the radii of the surfaces, R, and any
surface deformation that arises during an interaction (Israelachvili and Adams, 1978; Chen et al., 1992).
The distance between the two surfaces can also be independently controlled to within 1 Å, and the force
sensitivity is about 10
–8
N (10
–6
g). For the typical surface radii of R ≈ 1 cm used in these experiments, γ
values can be measured to an accuracy of about ±10
–3
mJ/m
2
(±10
–3
erg/m
2
).
Various surface materials have been successfully used in SFA force measurements including mica
(Pashley, 1981, 1982, 1985), silica (Horn et al., 1989b), and sapphire (Horn et al., 1988).
It is also possible
to measure the forces between adsorbed polymer layers (Klein, 1983, 1986; Patel and Tirrell, 1989; Ploehn
and Russel, 1990), surfactant monolayers and bilayers (Israelachvili, 1987, 1991; Christenson, 1988a;
Israelachvili and McGuiggan, 1988), and metal and metal oxide layers deposited on mica (Coakley and
Tabor, 1978; Parker and Christenson, 1988; Smith et al., 1988; Homola et al., 1993; Steinberg et al., 1993).
The range of liquids and vapors that can be used is almost endless, and so far these have included aqueous
solutions, organic liquids and solvents, polymer melts, various petroleum oils and lubricant liquids, and
liquid crystals.
Recently, new friction attachments were developed suitable for use with the SFA (Homola et al., 1989;
Van Alsten and Granick, 1988, 1990b; Klein et al., 1994; Luengo et al., 1997). These attachments allow
for the two surfaces to be sheared past each other at varying sliding speeds or oscillating frequencies
while simultaneously measuring both the transverse (frictional or shear) force and the normal force or
load between them. The externally applied load, L, can be varied continuously, and both positive and
negative loads can be applied. Finally, the distance between the surfaces D, their true molecular contact
area A, their elastic (or viscoelastic or elastohydrodynamic) deformation, and their lateral motion can
all be monitored simultaneously by recording the moving interference fringe pattern using a video
camera–recorder system.
ED
FD
R
()
=
()
π2
,