
32-44
REFERENCE
DATA
FOR ENGINEERS
regular hexagonal lattice. The resulting BFN is
a
three-
dimensional microwave network with multiple-ann
hybrid junctions but is simpler than cascading two-
dimensional Butler BF’Ns.”
Electronic Scanning
Some of the design tradeoffs for electronic scan-
ning, such
as
grating lobes, have been addressed
above. A large electronic scanning array, or phased
array, can be characterized in terms of Scan Impedance
and Scan Element Pattern; the modifier “scan” implies
a
quantity that varies with scan angles.
In
the Scan
Impedance approach, the pattern is written
as
the prod-
uct of three factors. First is the array factor (of isotro-
pic elements), which is
h,;
the second is the isolated
element pattern,
g,;
the last term involves the Scan
Impedance. These combine to give
a
gain pattern
of
where
R,
is the isolated element resistance,
R,
is the scan element resistance,
r,
is the scan reflection coefficient.
Scan Impedance can be measured only when
all
ele-
ments are radiating with the proper amplitude and
phase. The Scan Element Pattern can be measured
with
a
distant transmitter and all elements terminated
in
a
matched load. It shows relative behavior versus
scan angles. If one element is excited, relative angle
behavior is useful but the absolute value is not.
Although these formulas show only
8,
they apply in
general to two-dimensional scanning over
8,
4.
For
such large arrays,
a
powerful analysis was developed
by Oliner and colleagues using the unit cell concept.
Here, one element in a large array is seen to be closely
equivalent to an element in an infinite array; in the lat-
ter, the periodic nature
of
the array allows
a
single cell
to contain the entire characteristics of the array. This
cell, called the unit cell, consists of
a
virtual
waveguide with suitably chosen impedance walls with
the waveguide symmetrically located about the ele-
ment (typically
a
slot) in the element lattice. The wall
boundary conditions are derived from the scan angles.
These unit cells are normal to the array face and are
contiguous. Interior modes are
LSE
and/or
LSM.
If no
grating lobes exist, the conductance is given by the
single propagating mode
in
the unit cell waveguide,
and thus
a
closed
form
result occurs. All modes con-
tribute susceptance, and thus many series terms must
*
Williams,
W.
F., and Schroeder.
K.
G. “Performance
Analysis
of
Planar Hybrid Matrix Arrays.”
Trans.
ZEEE,
Val.
A€-27,
July
1969,
pp.
526-528.
McFarland,
J.
L.
“The
RN2
Multiple Beam-Array Family and Beam-Forming Matrix.”
IEEEAPS
Symp.
Digest,
1979,
pp.
728-731.
be computed. This Floquet method has proved to be
powerful and perceptive in the understanding of scan-
ning behavior
of
arrays. For more detailed informa-
tion, refer to Oliner and Malecht and Hansen.$
Applications to arrays of microstrip patches have also
been made.§
A blind spot can be produced in an array at
a
partic-
ular angle; the array radiation is zero at this angle.
This
occurs when the dominant mode is canceled by
a
higher mode, and can occur because of external or
internal structure. External structure often used for
matching or for protective purposes includes dielectric
sheets over or near the array face and dielectric plugs
protruding from waveguide-type elements. Internal
structure includes dielectric loaded waveguide ele-
ments, monopole loaded slots, etc. Blind spots can be
severe for large arrays but usually are negligible for
small arrays. In case
a
blind spot is experienced, the
array design can usually be changed to remove it.
Typ-
ical measures are reducing lattice dimensions, chang-
ing design to improve VSWR, and altering the
periodicity of the external structure. Simulators have
also proved useful. For more detailed information, see
Oliner and Malechj and Hansen.$
Small arrays are usually analyzed with the element-
by-element approach. Here,
a
matrix equation is set up
relating the drive voltage to the element currents times
the impedance matrix, using dipoles
as
an example.
These simultaneous equations are solved for the cur-
rents, from which the impedance of each element is
immediately available. Note that solution of complex
simultaneous equations is several times faster than
matrix inversion. Since the scan direction appears in
the drive vector, Scan Impedance is easily obtained.
This approach allows the variation
of
impedance from
center
to
edge elements to be determined. When the
elements are slots or dipoles,
a
convenient and efficient
computer algorithm for mutual impedance is useful.”
The effects
of
Scan Impedance change over
a
range of
scan angles can be reduced by designing the element
to have
a
pattern close to the “ideal” element pattern.
t
Oliner, A.
A.,
and Malech,
R.
G.
Chapters
3
and
4
in
Microwave Scanning Antennas.
Val.
11.
R.
C. Hansen (Ed.).
New
York: Academic
Press,
Inc.,
1966;
Los
Altos, CA: Pen-
insula
Publ.,
1985.
$
Hansen, R. C. Array chapters in
Handbook
of
Antenna
Design.
Vol.
2.
A.
W. Rudge et
al.
(Eds.). London: Peter Per-
egrinus Ltd.,
1983;
Phased
Array Antennas.
New York John
Wiley
&
Sons, Inc.,
1998.
0
Pozar,
D. M. “General Relations for a Phased Array of
Printed Antennas Derived from Infinite Current Sheets.”
Trans.
IEEE,
Vol.
AF-33,
May
1985,
pp.
498-504.
Lubin,
Y.,
and Hessel, A. “Wide-Band, Wide-Angle Microstrip Stacked-
Patch-Element Phased Arrays.”
Trans.
IEEE,
Val.
AP-39,
”
Hansen, R. C. “Formulation of Echelon Dipole
Mutual
Impedance for Computer.”
Trans. ZEEE,
Val.
AI-20,
Nov.
1972,
pp.
780-781.
Aug.
1991,
pp.
1062-1070.