
32-52
REFERENCE
DATA
FOR ENGINEERS
evident by comparing the Taylor with the popular
Hamming distribution. The latter* is
g(p)
=
0.54
+
0.46 cos
np
=
a
+
b
cos
np
The excitation efficiency of the Hamming is
=
2a2/(2a2
+
b2)
=
0.7338
The space factor has zeros at
u
=
2,
3, 4
....
and, in
addition, a zero at
u
= =
2.5981.
This close
spacing of the first three zeros produces an uneven
sidelobe envelope with the fourth sidelobe the highest
at 42.7 dB. Thus, the Hamming is compared with a
Taylor
E
distribution with
SLR
=
42.7 dB. Table 16
shows the zeros, and it can be observed that both
of
the
Taylor space factors have a smoothly increasing zero
spacing from the first zero out to the transition point,
beyond which the spacing is unity. The Hamming, on
the other hand, has a first spacing of
0.598,
a second
spacing
of
0.402, and the remaining spacings all unity.
This is obviously not
as
good a design, as the follow-
ing will show.
Table 17 gives efficiency and normalized beam-
width for the three Taylor cases and for the Hamming.
It may be seen that the Hamming beamwidth is
TABLE 16.
ZEROS OF DISTRIBUTIONS
FOR
SLR
=
42.7
DB
Taylor
n
One-Parameter Taylor Hamming
E=6 E=lO
1
2
3
4
5
6
7
8
9
10
2.112
2.732
3.550
4.412
5.335
6.282
7.243
8.214
9.190
10.172
1.894 1.897
2.398 2.396
3.173 3.166
4.069 4.056
5.020 5.002
6 5.978
7 6.970
8
7.974
9 8.984
10
10
2
2.598
3
4
5
6
7
8
9
10
TABLE 17. COMPARISON
OF
DISTRIBUTIONS
FOR
SLR
=
42.7
DB
Taylor
One-Parameter Taylor Hamming
E=6 E=lO
roughly 3% broader, while the efficiency is roughly
3% lower. Thus, by use of appropriate space factors
such as the Taylor
E,
improved performance can be
obtained at no additional cost in complexity, hardware,
or tolerances. For rectangular arrays with separable
aperture distributions, Taylor distributions may, of
course, be used along each coordinate. For circular
disk apertures, the circular Taylor
E
distribution is
similarly excellent.
Measurement
of
Low-Sidelobe
Patterns
In
addition to the obvious problem of providing a
pattern range with a low background level, the mea-
surement
of
low sidelobe patterns imposes restrictions
on the measurement distance. A distance of
W2/h
is
adequate for patterns with modest sidelobe ratios (25
dB
or less), but larger distances are needed
to
measure
lower sidelobes accurately, due to the quadratic phase
error produced by a finite distance.
As
the measure-
ment distance is reduced, the first sidelobe and first
null fills in, and then the sidelobe becomes a shoulder
on the main beam. (The second sidelobe is only
slightly raised at this point.) At closer distances, the
main beam broadens, and the second sidelobe and sec-
ond null rise, and again the main beam eventually
absorbs the sidelobe. Calculations have been made of
the change in sidelobe level versus measurement dis-
tance for the universal Taylor
E
linear space factor.?
Fig.
90
gives these results for a uniform line source,
u
z
x
E
00
il
P
s
%
0
0
0.5
1.0
2
5
10
Y
=R/(2@/!4
u3
0.694
0.637 0.635
0.651
rl
0.690
0.754
0.755 0.734
Fig.
90.
Sidelobe increase due to measurement distance.
*
Blackman,
R.
B.,
and Tukey,
J.
W.
Measurement
of
Power Spectra.
New
York: Dover Publications,
Inc.,
1958.
f
Hansen,
R.
C.
“Measurement Distance Effects on
Low
Sidelobe Patterns.”
Trans.
IEEE,
Vol.
A€-32,
June
1984;
pp.
591-594.