• формат pdf
  • размер 2.94 МБ
  • добавлен 11 апреля 2011 г.
Eaton G.R., Eaton S.S., Barr D.P., Weber R.T. Quantitative EPR
SpringerWienNewYork, 2010, 185 pages, 110 Figures
There is a growing need in both industrial and academic research to obtain accurate
quantitative results from continuous wave (CW) electron paramagnetic resonance
(EPR) experiments. This book describes various sample-related, instrument-related
and software-related aspects of obtaining quantitative results from EPR experiments.
Some specific items to be discussed include: selection of a reference
standard, resonator considerations (Q, B1, Bm), power saturation, sample positioning,
and finally, the blending of all the factors together to provide a calculation
model for obtaining an accurate spin concentration of a sample. The book contains sufficient background to make it useful to scientists who are
new to the field, and who strive to obtain the best possible results from their
spectrometers.
Похожие разделы
Смотрите также

Birdi K.S. Scanning probe microscopes. Application in science and technology

  • формат pdf
  • размер 14 МБ
  • добавлен 04 января 2011 г.
CRC Press, 2003, 310p. Introduction Background History of Microscopy Scanning Probe Microscopes (SPMs) Scanning Tunneling Microscope (STM) Electron Tunneling Atomic Force Microscope (AFM) Modes of Operation of AFM Simultaneous AFM and Scanning Near-Field Fluorescence (SNOM and SNOM–AFM) Friction Force Microscopy (FFM) STM and AFM Studies under Fluids Sample Preparation Procedures for STM and AFM Calibration and Image Analysis of STM and AFM...

Cremers D.A., Radziemski L.J. Handbook of Laser-Induced Breakdown Spectroscopy

  • формат pdf
  • размер 5.01 МБ
  • добавлен 12 марта 2011 г.
John Wiley & Sons, Ltd. 2006. 313 p. History Basics of the LIBS Plasma Apparatus Fundamentals Determining LIBS Analytical Figures-of-Merit Qualitative LIBS Analysis Quantitative LIBS Analysis Remote LIBS Measurements Examples of Recent LIBS Fundamental Research, Instruments and Novel Applications The Future of LIBS

Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope

  • формат pdf
  • размер 11.47 МБ
  • добавлен 04 сентября 2011 г.
3rd edition, Springer Science+Business Media, New York, 2011, 491 pages Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation...

Egerton R.F. Physical Principles of Electron Microscopy. An Introduction to TEM, SEM, and AEM

  • формат pdf
  • размер 5.38 МБ
  • добавлен 12 января 2011 г.
Springer, 2005, 202p. Preface An Introduction to Microscopy Limitations of the Human Eye The Light-Optical Microscope The X-ray Microscope The Transmission Electron Microscope The Scanning Electron Microscope Scanning Transmission Electron Microscope Analytical Electron Microscopy Scanning-Probe Microscopes Electron Optics PropertiesofanIdealImage ImaginginLightOptics ImagingwithElectrons Focusing Properties of a Thin Magnetic Lens C...

Goldstein J., Newbury D. et al. Scanning electron microscopy and X-ray microanalysis

  • формат pdf
  • размер 122.63 МБ
  • добавлен 21 января 2011 г.
3 ed. , Kluwer, 2003, 689p. Introduction The SEM and Its Modes of Operation Electron Beam Specimen Interactions Image Formation and Interpretation Special Topics in Scanning Electron Microscopy Generation of X Rays in the SEM Specimen X-Ray Spectral Measurement: EDS and WDS Qualitative X-Ray Analysis Quantitative X-Ray Analysis: The Basics Special Topics in Electron Beam X-Ray Microanalysis Specimen Preparation of Hard Materials: Metals, C...

Merkus H.G. Particle Size Measurements: Fundamentals, Practice, Quality

  • формат pdf
  • размер 10.94 МБ
  • добавлен 14 января 2012 г.
Springer Science+Business Media, 2009, ISBN: 1402090153, 533 pages This book focuses on the practical aspects of particle size measurement: a major difference with existing books, which have a more theoretical approach. Of course, the emphasis still lies on the measurement techniques. For optimum application, their theoretical background is accompanied by quantitative quality aspects, limitations and problem identification. Introduction Part...

Reed S.J.B. Electron microprobe analysis and scanning electron microscopy in geology

  • формат pdf
  • размер 4.68 МБ
  • добавлен 11 октября 2010 г.
Published in the United States of America by Cambridge University Press, New York Second edition 2005 216 p. Electron microprobe analysis Scanning electron microscopy Geological applications of SEM and EMPA Related techniques Electron–specimen interactions Inelastic scattering Electron range Elastic scattering Secondary-electron emission X-ray production X-ray absorption The Auger effect and fluorescence yield Cathodolumin...

Vickerman J.C., Gilmore I.S. (eds.) Surface analysis - the principal techniques

  • формат pdf
  • размер 15.8 МБ
  • добавлен 01 марта 2011 г.
2nd Ed. , 2009, John Wiley & Sons, 666 p. Introduction How do we De?ne the Surface? How Many Atoms in a Surface? Information Required Surface Sensitivity Radiation Effects – Surface Damage Complexity of the Data Auger Electron Spectroscopy Introduction Principle of the Auger Process Instrumentation Quantitative Analysis Depth Pro?le Analysis Summary Electron Spectroscopy for Chemical Analysis Overview X-ray Interaction withMatter, t...

Watts J.F., Wolstenholme J. An Introduction to Surface Analysis by XPS and AES

  • формат pdf
  • размер 12.72 МБ
  • добавлен 19 января 2011 г.
Wiley, 2003, 212p. Electron spectroscopy: some basic concepts Electron spectrometer design The electron spectrum: qualitative and quantitative interpretation Compositional depth profiling Applications of electron spectroscopy in materials science Comparison of XPS and AES with other analytical techniques

Williams D.B., Carter C.B. Transmission Electron Microscopy. A Textbook for Materials Science

  • формат pdf
  • размер 44.64 МБ
  • добавлен 21 января 2011 г.
2nd ed. , Springer, 2009. - 832 p. = BASICS The Transmission Electron Microscope Scattering and Diffraction Elastic Scattering Inelastic Scattering and Beam Damage Electron Sources Lenses, Apertures, and Resolution How to ‘See’ Electrons Pumps and Holders The Instrument Specimen Preparation = DIFFRACTION Diffraction in TEM Thinking in Reciprocal Space Diffracted Beams Dispersion Surfaces Diffraction from Crystals Diffraction from Small Volumes...