233Epitaxial growth of graphene thin films on single crystal metal surfaces
© Woodhead Publishing Limited, 2011
  Finally, note that the above discussion applied to graphene on metal surfaces 
with a threefold symmetry. Much less literature addresses graphene prepared 
on, for example, (100) surfaces of fcc metals (Hamilton, 1980; Zhao, 2011) 
or (110) surfaces of body-centred cubic metals. On these metals graphene/
metal moirés are also found, but their symmetry is decreased compared to 
that of moirés with graphene on threefold symmetric surfaces.
10.2.2  Height of the graphene sheet
The  distance  between  the  metallic  surface  and  the  graphene  surface  is 
characteristic  of  the  metal/graphene  interaction.  extreme  cases  for  this 
interaction are van der Waals binding, such as in between the graphite plane, 
and strong hybridization of the metal d bands with the p bands of graphene. 
While the rst case mostly preserves the conical character of graphene  p 
bands, the second deeply modies them, causing band gap opening at the K 
point in the brillouin zone and bending of the bands. In both cases, charge 
transfer between graphene and the metal is a priori expected.
  In the case of dominating van der Waals interactions, as in graphite, the 
graphene–metal distance is expected to be close to the graphite interplane 
distance,  i.e.  around  0.345  nm.  In  the  opposite  situation,  the  carbon  and 
metal atoms form  bonds with a covalent  character, therefore the distance 
is expected to be much shorter (e.g. 0.21 nm for graphene/Ni(111); Gamo, 
1997).
  The graphene–metal distance remains poorly characterized at experimental 
level. This is mainly ascribed to the limitations of the techniques that are 
commonly employed: sTM has so far been unable to disentangle topographic 
and  electronic  contributions  to  the  apparent  height  measurements  in  the 
graphene–metal system (Marchini, 2007; Vazquez de Parga, 2008); atomic 
force microscopy (aFM) was only used in air for graphene on metals, so 
that the sensitivity of the technique does not allow for a sufciently accurate 
determination of the height. The only techniques which proved relevant up to 
now are LEED I-V measurements and SXRD which were applied to graphene 
on Ni(111), Ru(0001), and Pt(111) (Gamo, 1997a; Martoccia, 2008; Sutter, 
2009a; Moritz, 2010). The analysis of the SXRD data relies on the choice 
of structural models a  priori, which introduces an (unknown) uncertainty 
in the value of the graphene–metal height. The LEED I-V analysis is based 
on  the  simulation  of  electron  reectivity  using  a  dynamical  diffraction 
framework, which allows a partial agreement between the simulations and 
the experiment, thus imposing careful interpretation of the simulations.
  Concerning theory studies, a number of reports provide estimates of the 
graphene–metal distance (Bertoni, 2004; Nemec, 2006, 2008; Giovannetti, 
2008; Wang, 2009; Khomyakov, 2009; Ran, 2009). Yet, noticeable deviations 
are found, for example for graphene/Pd(111) (Nemec, 2006; Giovannetti, 
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