716 Index
rotoinversion, 36
round lens
aberrations of, 166
azimuthal velocity component, 154
general solution, 156
radial force component, 154
ray, 156
two lenses in series, 154
round magnetic lens, 143
Runge–Kutta integration, 151
rutile, zone axis patterns, 209
sample preparation
diamond saw, 240
EDM, 240
electro-polishing, 240
etching, 241
mechanical punch, 240
pitting, 241
polishing, 241
sample thickness, 347
sampling, 222
sampling interval, 222
sampling rate, 222, 232
sampling theorem, 222, 441
saturation
of detector, 225
scalar magnetic potential, 144, 178
scalar product
of functions, 82, 104
of vectors, 6
scanning attachment, 175, 432
scanning electron microscope, 87
scattering matrix, 312, 327, 380, 400
numerical computation, 312
thickness dependence, 313
two beam case, 499
Sch, 594
Scherzer, 594
Scherzer defocus, 601
example, 602
Scherzer frequency, 613
Scherzer’s theorem, 169
Schockley partial dislocation, 493
Schottky effect, 181
Schottky electron gun, 189
Schr¨odinger equation, 81, 85, 94, 111, 303,
315
Schœnflies notation, 35
scintillator, 224
screw axis, 37, 46, 330, 528
handedness, 37
second condensor aperture, 198
second condensor lens, 197
second law of crystal habit, 9
second-order Laue zone, 212
Seidel aberrations, 631
Seitz symbol, 40, 128
selected area aperture, 206, 219, 524
selected area plane, 206, 219
SEM, 87
sextupole corrector, 597
shape amplitude, 119, 121, 350, 576
shape function, 330, 350, 461, 537, 565
relrod, 121
short-range order, 239
short-range ordered structures, 557
shot noise, 225
Si, 417
side-entry stage, 201
sign convention, 104
signal-to-noise ratio, 223, 614
Simpson’s rule, 150
single-scattering approximation, 348
Singleton algorithm, 109
site occupation operator, 571
site occupation parameter, 62
skew trajectory, 148
small-angle approximation, 163
Snell’s law, 96
SO-163, 272
solid angle, 184
solid solution, 238
source spread function, 608
space group, 62, 128, 237, 330, 460
computer implementation, 64
definition, 46
encoding, 64
first setting, 46
generators, 64
non-symmorphic, 46, 280, 555
second setting, 46
symmorphic, 46, 555
spatial coherence, 606
spatial coherence width, 193
spatial incoherence envelope, 615
spatial incoherence envelope function, 610
spatial incoherence information limit, 617
special theory of relativity, 80, 89
Einstein time-dilatation, 91
energy–mass equivalence, 91
Lorentz–Fitzgerald contraction, 91
specimen attitude, 202
specimen height, 202
specimen preparation
artifacts, 242
mechanical support ring, 248
mounting wax, 246
spectral factorization, 326
sphalerite, 243
spherical aberration, 168, 169, 204, 256, 592, 595
fifth order, 597
spherical aberration corrector, 204, 623
spherical aberration reduction/correction, 170
spherical point scatterers, 111
spinel, 417
spinodal decomposition, 557, 564
spot size, 196, 198, 255
SRO, 239
stacking fault, 242, 485, 493
stacking symbol, 241
standard Cartesian frame, 56
standard deviation, 223
standard procedures manual, 236