
12-38
REFERENCE DATA FOR ENGINEERS
the equipment
is
small relative to the dimensions of the
cell. For EM1 measurements, a receiver is connected as
the load to the cell, and for EMS measurements, a
signal generator
is
connected as the source. The TEM
cell is completely shielded. As the cell dimensions
become comparable to the wavelength, higher-order
modes will affect the calibration thus creating a high-
frequency usage limit known as the cutoff frequency.
The cutoff frequency is raised considerably
in
a special
form of the TEM cell* where the voltage and current
on
the transmission line are internally terminated and the
associated electromagnetic field is absorbed.
Strip-line cells? are sometimes used for testing small
electronic modules. They are inexpensive, easy
to
build, and economical of bench space. Unfortunately,
they are not shielded, and their use is therefore limited
to preliminary testing and troubleshooting.
Emission sources may be located during trouble-
shooting with inexpensive, small hand-held probes$ for
magnetic fields. Such probes may also be used to inject
fields for localized susceptibility tests.
REFERENCES
Error Correction
1.
2.
3.
4.
5.
Kruppa, W., and Sodomsky,
K.
F. “An explicit
solution for the scattering parameters of a linear
two-port measured with an imperfect test set.”
IEEE Trans. Microwave Theory Tech.,
Vol. MTT-
19, Jan. 1971, pp. 122-123.
Speciale,
R.
A.
“A generalization of the TSD
network-analyzer calibration procedure, covering
n-port scattering-parameter measurements, affect-
ed by leakage errors.”
IEEE Trans. Microwave
Theory Tech.,
Vol. MTT-25, Dec. 1977, pp.
Fitzpatrick,
J.
“Error models for systems measure-
ments.”
Microwave
J.,
No.
5,
1978, pp. 63-66.
Engen, 6. F., and Hoer, C. A. “Thru-reflect-line:
An
improved technique for calibrating the dual
six-port automatic network analyzer.
”
IEEE
Trans. Microwave Theory Tech.,
Vol.
MTT-27,
Apr. 1979, pp. 987-993.
Soares, R. A., et al. “A unified mathematical
approach
to
two-port calibration techniques
and
some
applications.
”
IEEE
Trans. Microwave The-
ory Tech.,
Vol. 37, Nov. 1989, pp. 1669-1674;
also Vol. 38, Aug. 1990, pp.
1144-1
145.
E
100-1 1
15.
-
*
Wilson,
P.,
Hansen, D., Koenigstein,
D.
“Simulating
Open
Area
Test
Site Emission Measurements Based on Data
Obtained
in
a Novel TEM Cell,’’ IEEE 1989 International
Symposium
on
EMC, IEEE Cat.
No.
89CH2736-7,
pp.
I71 -177.
t
Engineering
Design
Handbook-EMC.
DARCOM-P 706-
410
(US
Army;
pp.
7-49).
5
Terrien,
M.
“EM1 Troubleshooting Techniques Utilizing
a Broadband Magnetic Field Sensor.
”
International Zurich
Symposium
on
EMC, 1987.
6.
Eul,
H. J., and Schiek,
B.
“A
generalized theory
and new calibration procedures for network analyz-
er self-calibration.
”
IEEE Trans. Microwave The-
ory Tech.,
Vol. 39, Apr. 1991, pp. 724-731.
7.
Eul,
H.
J.,
and Schiek,
B.
“Reducing the number
of calibration standards for network analyzer cali-
bration.”
IEEE Trans. Instrum. Meas.,
Vol. 40,
8. Butler, John V.; Rytting, Douglas K.; Iskander,
Magdy F.; Pollard, Roger D.; and Vanden Bossche,
Marc.
‘‘
16-term error model and calibration proce-
dure for on-wafer network analysis measure-
ments.”
IEEE Trans. Microwave Theory Tech.,
Vol. 39, No. 12, Dec. 1991, pp. 2211-2217.
9. Silvonen, Kimmo J. “A general approach to
network analyzer calibration.
”
IEEE Trans. Mi-
crowave Theory Tech.,
Vol.
40,
No.
4, Apr. 1992.
Aug. 1991, pp. 732-735.
Time and Frequency
Measurement
10.
Barnes,
J.
A., et al. “Characterization of Frequen-
cy Stability.”
IEEE Trans. Instrum. Meas.,
Vol.
IM-20, No.
2,
May 1971, pp. 105-120.
11.
“Standard Frequencies and Time Signals.”
Vol.
VII, CCIR
XI11
Plenary Assembly. Geneva: Inter-
national Telecommunication Union, 1975, p. 18.
12. Fischer, Michael C. “Frequency Stability Mea-
surement Procedures.
”
Proceedings, Eighth An-
nual PTTI Meeting, Goddard Space Flight Center,
Code 250, Greenbelt, Md., 1976, pp. 575-618.
13. Fischer, Michael C. “Analyze Noise Spectra With
Tailored Test Gear.”
Microwaves,
Vol.
18,
No. 7,
July 1979, pp. 66-75.
14.
Fundamentals
of
the Electronic Counters,
Appli-
cation Note 200.
Palo
Alto, Calif.: Hewlett-
Packard
,
1978.
15.
Fundamentals
of
Time and Frequency Standards,
Application Note 52-1. Palo Alto, Calif.: Hewlett-
Packard, 1974.
16. Kartaschoff, Peter.
Frequency and Time.
New
York: Academic Press, Inc., 1978.
17. Manassewitsch, Vadim.
Frequency Synthesizers
Theory and Design.
2nd ed. New York: John Wiley
&
Sons, Inc., 1980.
18.
Oliver,
B.
M.,
and Cage,
J.
M.,
eds.
Electronic
Measurements and Instrumentation.
New York:
McGraw-Hill
Book
Co.,
1971, Ch. 6.
19. Rutman, Jacques. “Characterization
of
Phase and
Frequency Instabilities in Precision Frequency
Sources: Fifteen Years of Progress.
”
Proceedings
of
the
IEEE,
Vol. 66, No.
9,
Sept. 1978, pp.
1048- 1075.
20.
Timekeeping and Frequency Calibration,
Applica-
tion Note 52-2. Palo Alto, Calif., Hewlett-
Packard
,
1979.
21.
Vessot, Robert F. C., et
al.
“Research With a Cold
Atomic Hydrogen Maser.
”
Proceedings 33rd Fre-
quency Control Symposium.
Washington,
D.C.: