• формат pdf
  • размер 1.97 МБ
  • добавлен 19 февраля 2011 г.
Signal Processing and Electronics for Nuclear Spectrometry
IAEA, Proceedings of a Technical Meeting Vienna, 20–23 November 2007

All nuclear spectrometry systems contain electronic circuits and devices, commonly referred to as front-end electronics, which accept and process the electrical signals produced by radiation detectors. This front-end electronics are composed of a chain of signal processing subsystems that filter, amplify, shape, and digitise these electrical signals to finally produce digitally encoded information about the type and nature of the radiation that stimulated the radiation detector. The design objective of front-end electronics is to obtain maximum information about the radiation and with the highest possible accuracy.
Historically, the front-end electronics has consisted of all analog components. The performance delivered has increased continually over time through the development and implementation of new and improved analog electronics and electronic designs. The development of digital electronics, programmable logic, and digital signal processing techniques has now enabled most of the analog front-end electronics to be replaced by digital electronics, opening up new opportunities and delivering new benefits not previously achievable. Digital electronics and digital signal processing methods are enabling advances in numerous spectrometry applications such as lightweight, portable and hand held radiation instruments, and high-resolution digital medical imaging systems.
The objective of this technical meeting was to review the current status, developments and trends in nuclear electronics and signal processing, and their application with various radiation detectors. The meeting discussed the problems faced and the solutions employed, to improve the performances of data acquisition systems and high-tech equipment used for nuclear spectrometry. Presentations made at the meeting elaborated operational experiences with mode signal processing and electronics, and highlighted the latest developments in this field. This publication summarizes the findings and conclusions arising from this technical meeting.
Похожие разделы
Смотрите также

Czanderna A.W., Powell C.J., Madey T.E. (Eds.) Specimen Handling, Preparation, and Treatments in Surface Characterization

  • формат pdf
  • размер 2.35 МБ
  • добавлен 27 января 2011 г.
Kluwer Academic Publishers, 2002, 302 p. Ultrahigh Vacuum and Vacuum Compatibility of Materials Cryogenic Sample Transfer for Preservation of Surface Chemistry Specimen Handling: Cleaning and Processing Atomically Clean Surfaces of Elemental Solids Specimen Treatments: Surface Preparation of Metal Compound Materials (Mainly Oxides) In Situ Processing by Gas or Alkali Metal Dosing and by Cleavage Chemical Modification of Surfaces Physical and C...

Debertin K. and Helmer R. Gamma - and X-ray spectrometry with semiconductor detector

  • формат pdf
  • размер 21.4 МБ
  • добавлен 15 января 2011 г.
North-Holland, Amsterdam, 1988, 399 p., (анг. яз. ) The advent of germanium and silicon detectors in the 1960's has revolutionized gamma- and X-ray spectrometry. The excellent energy resolution of these semiconductor detectors has been the basis for rapid and sometimes step-like progress. Today there is scarcely a field in natural science to which spectrometry with semiconductor detectors has not gained entry. The authors estimate that worldwide...

Kauppinen J., Partanen J. Fourier Transforms in Spectroscopy

  • формат pdf
  • размер 4.17 МБ
  • добавлен 03 октября 2011 г.
WILEY-VCH Verlag, Berlin, 2001, 271 Pages This modern approach to the subject is clearly and logically structured, and gives readers an understanding of the essence of Fourier transforms and their applications. All important aspects are included with respect to their use with optical spectroscopic data. Based on popular lectures, the authors provide the mathematical fundamentals and numerical applications which are essential in practical use....

Neutron Imaging: A Non-Destructive Tool for Materials Testing

  • формат pdf
  • размер 2.82 МБ
  • добавлен 19 февраля 2011 г.
IAEA, Report of a coordinated research project 2003–2006, Vienna, 2008 Neutron radiography is a powerful tool for non-destructive testing of materials for industrial applications and research. The neutron beams from research reactors and spallation neutron sources have been extensively and successfully used for neutron radiography over the last few decades. The special features of neutron interaction with matter make it possible to inspect bulk...

Prutton M., Gomati M.M. El (Eds.) Scanning Auger electron microscopy

  • формат pdf
  • размер 53.21 МБ
  • добавлен 15 марта 2011 г.
John Wiley & Sons, 2006, 368p. Introduction The Auger Process Instrumentation The Spatial Resolution Forming an Auger Image Image Processing and Interpretation Quanti?cation of Auger Images Applications: Materials Science Applications: Semiconductor Manufacturing Concluding Remarks

Reilly D., Ensslin N. and Smith H.Jr. Passive Nondestructive Assay of Nuclear Materials

  • формат pdf
  • размер 44.2 МБ
  • добавлен 10 января 2011 г.
U.S. Nuclear Regulatory Commission, Washington, DC 20555, NRC FIN A724, 1991, -700p. (Анг. яз. ) This book is a general reference on the theory and application of PAssive NonDestructive Assay (NDA) techniques, or PANDA. It is part of a four-volume set on nuclear material measurement and accountability sponsored by the US Nuclear ,Regulatory Commission (NRC). Although we discuss a few active NDA techniques, they have been treated in detail in an...

Tsimring Sh.E. Electron Beams and Microwave Vacuum Electronics

  • формат pdf
  • размер 6.54 МБ
  • добавлен 13 октября 2011 г.
Wiley-Interscience, 2007 573 pages This book focuses on a fundamental feature of vacuum electronics: the strong interaction of the physics of electron beams and vacuum microwave electronics, including millimeter-wave electronics. The author guides readers from the roots of classical vacuum electronics to the most recent achievements in the field. Special attention is devoted to the physics and theory of relativistic beams and microwave devices,...

Van Grieken R., Markowicz A.A. (Eds.) Handbook of X-Ray Spectrometry

  • формат pdf
  • размер 10.26 МБ
  • добавлен 21 января 2012 г.
2nd edition, Revised and Expanded - Marcel Dekker, 2002, 985 pages Updates fundamentals and applications of all modes of x-ray spectrometry. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum. X-ray Physics Wavelength-Dispersive X-ray Fluorescence Energy-Dispersive X-ray Fluorescence Analysis Using X-ray Tube Excitation Spectrum Evaluation Quantification of Infinitely Thick Specimens by X...

Williams D. (ed.). Methods of Experimental Physics. Vol. 3. Molecular Physics

  • формат pdf
  • размер 13.62 МБ
  • добавлен 06 января 2011 г.
Academic Press Inc, 1962. - 775 pages. With the presentation of this volume on molecular physics we reach just about the half-way mark in the publication of our series on experimental physics. This occasion gives me a chance to review briefly the present status of the whole series and the expectations for finishing the Nuclear Physics, 5A, is going job. First of all the companion volume to I sincerely hope to come out soon. The manuscripts are c...

Williams D.B., Carter C.B. Transmission Electron Microscopy. A Textbook for Materials Science

  • формат pdf
  • размер 44.64 МБ
  • добавлен 21 января 2011 г.
2nd ed. , Springer, 2009. - 832 p. = BASICS The Transmission Electron Microscope Scattering and Diffraction Elastic Scattering Inelastic Scattering and Beam Damage Electron Sources Lenses, Apertures, and Resolution How to ‘See’ Electrons Pumps and Holders The Instrument Specimen Preparation = DIFFRACTION Diffraction in TEM Thinking in Reciprocal Space Diffracted Beams Dispersion Surfaces Diffraction from Crystals Diffraction from Small Volumes...