Surfaces 17
mode). At that distance, only electric and magnetic forces can be detected. Other
forces, such as the Van der Waals, chemical bonds or capillary forces (see section
2.5.1) are only detectable at closer distances (a few tens of nanometers).
Force curves
Force curves show the variations in the interaction force between the tip and
the surface within a charge/discharge (or approach/withdrawal) cycle (see Figure
1.18).
When the AFM probe is far from the sample’s surface, molecular interaction
forces are weak and the cantilever’s deflection is near zero (see Figure 1.18a).
When the piezo-electric tube is actioned in order to bring the sample into contact
with the probe, two things can occur when the surfaces are sufficiently close
together (see Figure 1.15):
1) There is attraction and we observe that the probe jumps towards the surface
of amplitude į
1
> 0. This jump is due to Van der Waals-type interactions and reveals
information about their strength (this case is shown in Figure 1.18).
2) There is repulsion between the two surfaces (į
1
< 0).
If, once contact is established, the sample continues to be displaced towards the
probe, we observe a deflection of the cantilever (see Figure 1.18b) that varies
linearly with the displacement. Because the cantilever is flexible, it deforms
proportionally to the sample displacement, provided the probe does not indent the
surface.
If we now consider the withdrawal phase, we observe that the interruption of the
probe-sample contact occurs well beyond the position that would correspond to zero
force. We note in particular that į
2
, which represents the non-contact jump, is greater
than į
1
. į
2
accounts for the adhesion force between surfaces. With increased
adhesion, more energy will be required to break the contact and hence there will be
greater deflection of the cantilever į
2
(see Figure 1.18c).
The adhesion force is simply obtained by multiplying į
2
by k, the spring constant
of the cantilever (F
ad
= kį
2
).