Materials for Tribology 159
ejected from the target to form oxide or nitride films. This technique is referred to as
reactive sputtering and allows films of TiN, CrN, AlN, SiO
2
or TiON to be easily
obtained.
After deposition of the coating, it is possible to negatively polarize the sample
being treated in order to attract argon ions and thus submit it to ionic bombardment.
This treatment can also be performed during film preparation. It effectively
increases the density of the deposition material and yields improvement in the
interface quality and in the adhesion between different layers for multi-layered
material deposition. This has been clearly demonstrated in the case of multilayered
TiN/AlN films [THOB 99, THOB 00]. In addition, ionic deposition can also be
assisted by a beam of argon ions that bombard the film during growth. Many alloys
such as TiB
2
, SiC or NiTiN have been produced in this way and deposited onto
silicon, steel and TA6V substrates [RIV 00].
However, applying a continuous voltage to the cathode does not allow the
sputtering on targets made of insulating material, because sputtering is rapidly
arrested by the accumulation of surface charge. This problem is solved using a radio
frequency system where an alternating voltage is applied to the cathode. With this
technique, argon ions bombard the surface of the target material and eject the
surface atoms during the negative-going polarization phase. When the polarization is
reversed, the cathode attracts the electrons which then neutralize the positive surface
charge.
The deposition speed depends on a number of parameters such as the sputtering
yield of the target material, the kinetic energy of the argon ions and the reactor
geometry. The deposition speed can be greatly increased by fitting the sample-
holder with a magnetron (Figure 3.34) in order to apply a strong magnetic field
using magnets placed behind the target. Electrons therefore follow the magnetic
field lines and follow a helical path. This significantly increases the length of their
trajectory and, as a result, the number of their collisions with argon atoms. The
ensuing increase in the number of argon ions leads to greater sputtering and enhanced
deposition speeds.
Films produced through cathodic sputtering are generally characterized by a
columnar structure with a morphology that depends on the pressure and on the ratio
between the deposition temperature (T) and melting point of the material deposit
(Tm).
Figure 3.35 shows a schematic representation of typical microstructures obtained.
For a relative temperature (T/Tm) between 0 and 0.4, the structure obtained is porous
and the columns are very thin (see Figure 3.35a). When the relative temperature is
between 0.6 and 0.8, the columns join together and the structure of the material is